About IBERLEEM
Join us for the 1st Spanish meeting on Microscopy with Low-Energy Electrons (IBERLEEM) comprising both low-energy electron microscopy (LEEM) as well as photoemission microscopy (PEEM) where we explore cutting-edge techniques for imaging and surface analysis. We have decided to launch these meetings both to meet people that have used such instruments in the past as well as researchers interested in the technique. We believe now it the time to start such meetings given that Spain boasts not one but two low-energy electron microscopes: the one at the Alba synchrotron and the one at the Instituto de Química Física Blas Cabrera.
Important dates:
- Abstract submission: 15 may to 15 july
- Acceptance of abstracts: 31 july
- Registration 15 may to 15 september
- Conference days: 15-17 october